A Compact Vertical Scanner for Atomic Force Microscopes

A compact vertical scanner for an atomic force microscope (AFM) is developed. The vertical scanner is designed to have no interference with the optical microscope for viewing the cantilever. The theoretical stiffness and resonance of the scanner are derived and verified via finite element analysis....

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Detalles Bibliográficos
Autores principales: Park, Jae Hong, Shim, Jaesool, Lee, Dong-Yeon
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Molecular Diversity Preservation International (MDPI) 2010
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3231096/
https://www.ncbi.nlm.nih.gov/pubmed/22163492
http://dx.doi.org/10.3390/s101210673
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author Park, Jae Hong
Shim, Jaesool
Lee, Dong-Yeon
author_facet Park, Jae Hong
Shim, Jaesool
Lee, Dong-Yeon
author_sort Park, Jae Hong
collection PubMed
description A compact vertical scanner for an atomic force microscope (AFM) is developed. The vertical scanner is designed to have no interference with the optical microscope for viewing the cantilever. The theoretical stiffness and resonance of the scanner are derived and verified via finite element analysis. An optimal design process that maximizes the resonance frequency is performed. To evaluate the scanner’s performance, experiments are performed to evaluate the travel range, resonance frequency, and feedback noise level. In addition, an AFM image using the proposed vertical scanner is generated.
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spelling pubmed-32310962011-12-07 A Compact Vertical Scanner for Atomic Force Microscopes Park, Jae Hong Shim, Jaesool Lee, Dong-Yeon Sensors (Basel) Article A compact vertical scanner for an atomic force microscope (AFM) is developed. The vertical scanner is designed to have no interference with the optical microscope for viewing the cantilever. The theoretical stiffness and resonance of the scanner are derived and verified via finite element analysis. An optimal design process that maximizes the resonance frequency is performed. To evaluate the scanner’s performance, experiments are performed to evaluate the travel range, resonance frequency, and feedback noise level. In addition, an AFM image using the proposed vertical scanner is generated. Molecular Diversity Preservation International (MDPI) 2010-11-30 /pmc/articles/PMC3231096/ /pubmed/22163492 http://dx.doi.org/10.3390/s101210673 Text en © 2010 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/).
spellingShingle Article
Park, Jae Hong
Shim, Jaesool
Lee, Dong-Yeon
A Compact Vertical Scanner for Atomic Force Microscopes
title A Compact Vertical Scanner for Atomic Force Microscopes
title_full A Compact Vertical Scanner for Atomic Force Microscopes
title_fullStr A Compact Vertical Scanner for Atomic Force Microscopes
title_full_unstemmed A Compact Vertical Scanner for Atomic Force Microscopes
title_short A Compact Vertical Scanner for Atomic Force Microscopes
title_sort compact vertical scanner for atomic force microscopes
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3231096/
https://www.ncbi.nlm.nih.gov/pubmed/22163492
http://dx.doi.org/10.3390/s101210673
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