Cargando…

Dynamic Uncertainty for Compensated Second-Order Systems

The compensation of LTI systems and the evaluation of the according uncertainty is of growing interest in metrology. Uncertainty evaluation in metrology ought to follow specific guidelines, and recently two corresponding uncertainty evaluation schemes have been proposed for FIR and IIR filtering. We...

Descripción completa

Detalles Bibliográficos
Autores principales: Eichstädt, Sascha, Link, Alfred, Elster, Clemens
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Molecular Diversity Preservation International (MDPI) 2010
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3231164/
https://www.ncbi.nlm.nih.gov/pubmed/22163618
http://dx.doi.org/10.3390/s100807621
_version_ 1782218158447263744
author Eichstädt, Sascha
Link, Alfred
Elster, Clemens
author_facet Eichstädt, Sascha
Link, Alfred
Elster, Clemens
author_sort Eichstädt, Sascha
collection PubMed
description The compensation of LTI systems and the evaluation of the according uncertainty is of growing interest in metrology. Uncertainty evaluation in metrology ought to follow specific guidelines, and recently two corresponding uncertainty evaluation schemes have been proposed for FIR and IIR filtering. We employ these schemes to compare an FIR and an IIR approach for compensating a second-order LTI system which has relevance in metrology. Our results suggest that the FIR approach is superior in the sense that it yields significantly smaller uncertainties when real-time evaluation of uncertainties is desired.
format Online
Article
Text
id pubmed-3231164
institution National Center for Biotechnology Information
language English
publishDate 2010
publisher Molecular Diversity Preservation International (MDPI)
record_format MEDLINE/PubMed
spelling pubmed-32311642011-12-07 Dynamic Uncertainty for Compensated Second-Order Systems Eichstädt, Sascha Link, Alfred Elster, Clemens Sensors (Basel) Article The compensation of LTI systems and the evaluation of the according uncertainty is of growing interest in metrology. Uncertainty evaluation in metrology ought to follow specific guidelines, and recently two corresponding uncertainty evaluation schemes have been proposed for FIR and IIR filtering. We employ these schemes to compare an FIR and an IIR approach for compensating a second-order LTI system which has relevance in metrology. Our results suggest that the FIR approach is superior in the sense that it yields significantly smaller uncertainties when real-time evaluation of uncertainties is desired. Molecular Diversity Preservation International (MDPI) 2010-08-13 /pmc/articles/PMC3231164/ /pubmed/22163618 http://dx.doi.org/10.3390/s100807621 Text en © 2010 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/).
spellingShingle Article
Eichstädt, Sascha
Link, Alfred
Elster, Clemens
Dynamic Uncertainty for Compensated Second-Order Systems
title Dynamic Uncertainty for Compensated Second-Order Systems
title_full Dynamic Uncertainty for Compensated Second-Order Systems
title_fullStr Dynamic Uncertainty for Compensated Second-Order Systems
title_full_unstemmed Dynamic Uncertainty for Compensated Second-Order Systems
title_short Dynamic Uncertainty for Compensated Second-Order Systems
title_sort dynamic uncertainty for compensated second-order systems
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3231164/
https://www.ncbi.nlm.nih.gov/pubmed/22163618
http://dx.doi.org/10.3390/s100807621
work_keys_str_mv AT eichstadtsascha dynamicuncertaintyforcompensatedsecondordersystems
AT linkalfred dynamicuncertaintyforcompensatedsecondordersystems
AT elsterclemens dynamicuncertaintyforcompensatedsecondordersystems