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Electromechanical Impedance Response of a Cracked Timoshenko Beam
Typically, the Electromechanical Impedance (EMI) technique does not use an analytical model for basic damage identification. However, an accurate model is necessary for getting more information about any damage. In this paper, an EMI model is presented for predicting the electromechanical impedance...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Molecular Diversity Preservation International (MDPI)
2011
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3231675/ https://www.ncbi.nlm.nih.gov/pubmed/22164017 http://dx.doi.org/10.3390/s110707285 |
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author | Zhang, Yuxiang Xu, Fuhou Chen, Jiazhao Wu, Cuiqin Wen, Dongdong |
author_facet | Zhang, Yuxiang Xu, Fuhou Chen, Jiazhao Wu, Cuiqin Wen, Dongdong |
author_sort | Zhang, Yuxiang |
collection | PubMed |
description | Typically, the Electromechanical Impedance (EMI) technique does not use an analytical model for basic damage identification. However, an accurate model is necessary for getting more information about any damage. In this paper, an EMI model is presented for predicting the electromechanical impedance of a cracked beam structure quantitatively. A coupled system of a cracked Timoshenko beam with a pair of PZT patches bonded on the top and bottom surfaces has been considered, where the bonding layers are assumed as a Kelvin-Voigt material. The shear lag model is introduced to describe the load transfer between the PZT patches and the beam structure. The beam crack is simulated as a massless torsional spring; the dynamic equations of the coupled system are derived, which include the crack information and the inertial forces of both PZT patches and adhesive layers. According to the boundary conditions and continuity conditions, the analytical expression of the admittance of PZT patch is obtained. In the case study, the influences of crack and the inertial forces of PZT patches are analyzed. The results show that: (1) the inertial forces affects significantly in high frequency band; and (2) the use of appropriate frequency range can improve the accuracy of damage identification. |
format | Online Article Text |
id | pubmed-3231675 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2011 |
publisher | Molecular Diversity Preservation International (MDPI) |
record_format | MEDLINE/PubMed |
spelling | pubmed-32316752011-12-07 Electromechanical Impedance Response of a Cracked Timoshenko Beam Zhang, Yuxiang Xu, Fuhou Chen, Jiazhao Wu, Cuiqin Wen, Dongdong Sensors (Basel) Article Typically, the Electromechanical Impedance (EMI) technique does not use an analytical model for basic damage identification. However, an accurate model is necessary for getting more information about any damage. In this paper, an EMI model is presented for predicting the electromechanical impedance of a cracked beam structure quantitatively. A coupled system of a cracked Timoshenko beam with a pair of PZT patches bonded on the top and bottom surfaces has been considered, where the bonding layers are assumed as a Kelvin-Voigt material. The shear lag model is introduced to describe the load transfer between the PZT patches and the beam structure. The beam crack is simulated as a massless torsional spring; the dynamic equations of the coupled system are derived, which include the crack information and the inertial forces of both PZT patches and adhesive layers. According to the boundary conditions and continuity conditions, the analytical expression of the admittance of PZT patch is obtained. In the case study, the influences of crack and the inertial forces of PZT patches are analyzed. The results show that: (1) the inertial forces affects significantly in high frequency band; and (2) the use of appropriate frequency range can improve the accuracy of damage identification. Molecular Diversity Preservation International (MDPI) 2011-07-22 /pmc/articles/PMC3231675/ /pubmed/22164017 http://dx.doi.org/10.3390/s110707285 Text en © 2011 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/). |
spellingShingle | Article Zhang, Yuxiang Xu, Fuhou Chen, Jiazhao Wu, Cuiqin Wen, Dongdong Electromechanical Impedance Response of a Cracked Timoshenko Beam |
title | Electromechanical Impedance Response of a Cracked Timoshenko Beam |
title_full | Electromechanical Impedance Response of a Cracked Timoshenko Beam |
title_fullStr | Electromechanical Impedance Response of a Cracked Timoshenko Beam |
title_full_unstemmed | Electromechanical Impedance Response of a Cracked Timoshenko Beam |
title_short | Electromechanical Impedance Response of a Cracked Timoshenko Beam |
title_sort | electromechanical impedance response of a cracked timoshenko beam |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3231675/ https://www.ncbi.nlm.nih.gov/pubmed/22164017 http://dx.doi.org/10.3390/s110707285 |
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