New developments in fabrication of high-energy-resolution analyzers for inelastic X-ray spectroscopy

In this work new improvements related to the fabrication of spherical bent analyzers for 1 meV energy-resolution inelastic X-ray scattering spectroscopy are presented. The new method includes the use of a two-dimensional bender to achieve the required radius of curvature for X-ray analyzers. The adv...

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Detalles Bibliográficos
Autores principales: Said, Ayman H., Sinn, Harald, Divan, Ralu
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2011
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3268696/
https://www.ncbi.nlm.nih.gov/pubmed/21525659
http://dx.doi.org/10.1107/S0909049511001828
Descripción
Sumario:In this work new improvements related to the fabrication of spherical bent analyzers for 1 meV energy-resolution inelastic X-ray scattering spectroscopy are presented. The new method includes the use of a two-dimensional bender to achieve the required radius of curvature for X-ray analyzers. The advantage of this method is the ability to monitor the focus during bending, which leads to higher-efficiency analyzers.

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