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Toward 100 Mega-Frames per Second: Design of an Ultimate Ultra-High-Speed Image Sensor

Our experience in the design of an ultra-high speed image sensor targeting the theoretical maximum frame rate is summarized. The imager is the backside illuminated in situ storage image sensor (BSI ISIS). It is confirmed that the critical factor limiting the highest frame rate is the signal electron...

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Autores principales: Dao, Vu Truong Son, Etoh, Takeharu Goji, Tanaka, Masatoshi, Nguyen, Hoang Dung, Le Cuong, Vo, Takehara, Kohsei, Akino, Toshiro, Nishi, Kenji, Aoki, Hitoshi, Nakai, Junichi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Molecular Diversity Preservation International (MDPI) 2009
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3270825/
https://www.ncbi.nlm.nih.gov/pubmed/22315524
http://dx.doi.org/10.3390/s100100016
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author Dao, Vu Truong Son
Etoh, Takeharu Goji
Tanaka, Masatoshi
Nguyen, Hoang Dung
Le Cuong, Vo
Takehara, Kohsei
Akino, Toshiro
Nishi, Kenji
Aoki, Hitoshi
Nakai, Junichi
author_facet Dao, Vu Truong Son
Etoh, Takeharu Goji
Tanaka, Masatoshi
Nguyen, Hoang Dung
Le Cuong, Vo
Takehara, Kohsei
Akino, Toshiro
Nishi, Kenji
Aoki, Hitoshi
Nakai, Junichi
author_sort Dao, Vu Truong Son
collection PubMed
description Our experience in the design of an ultra-high speed image sensor targeting the theoretical maximum frame rate is summarized. The imager is the backside illuminated in situ storage image sensor (BSI ISIS). It is confirmed that the critical factor limiting the highest frame rate is the signal electron transit time from the generation layer at the back side of each pixel to the input gate to the in situ storage area on the front side. The theoretical maximum frame rate is estimated at 100 Mega-frames per second (Mfps) by transient simulation study. The sensor has a spatial resolution of 140,800 pixels with 126 linear storage elements installed in each pixel. The very high sensitivity is ensured by application of backside illumination technology and cooling. The ultra-high frame rate is achieved by the in situ storage image sensor (ISIS) structure on the front side. In this paper, we summarize technologies developed to achieve the theoretical maximum frame rate, including: (1) a special p-well design by triple injections to generate a smooth electric field backside towards the collection gate on the front side, resulting in much shorter electron transit time; (2) design technique to reduce RC delay by employing an extra metal layer exclusively to electrodes responsible for ultra-high speed image capturing; (3) a CCD specific complementary on-chip inductance minimization technique with a couple of stacked differential bus lines.
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spelling pubmed-32708252012-02-07 Toward 100 Mega-Frames per Second: Design of an Ultimate Ultra-High-Speed Image Sensor Dao, Vu Truong Son Etoh, Takeharu Goji Tanaka, Masatoshi Nguyen, Hoang Dung Le Cuong, Vo Takehara, Kohsei Akino, Toshiro Nishi, Kenji Aoki, Hitoshi Nakai, Junichi Sensors (Basel) Review Our experience in the design of an ultra-high speed image sensor targeting the theoretical maximum frame rate is summarized. The imager is the backside illuminated in situ storage image sensor (BSI ISIS). It is confirmed that the critical factor limiting the highest frame rate is the signal electron transit time from the generation layer at the back side of each pixel to the input gate to the in situ storage area on the front side. The theoretical maximum frame rate is estimated at 100 Mega-frames per second (Mfps) by transient simulation study. The sensor has a spatial resolution of 140,800 pixels with 126 linear storage elements installed in each pixel. The very high sensitivity is ensured by application of backside illumination technology and cooling. The ultra-high frame rate is achieved by the in situ storage image sensor (ISIS) structure on the front side. In this paper, we summarize technologies developed to achieve the theoretical maximum frame rate, including: (1) a special p-well design by triple injections to generate a smooth electric field backside towards the collection gate on the front side, resulting in much shorter electron transit time; (2) design technique to reduce RC delay by employing an extra metal layer exclusively to electrodes responsible for ultra-high speed image capturing; (3) a CCD specific complementary on-chip inductance minimization technique with a couple of stacked differential bus lines. Molecular Diversity Preservation International (MDPI) 2009-12-24 /pmc/articles/PMC3270825/ /pubmed/22315524 http://dx.doi.org/10.3390/s100100016 Text en ©2010 by the authors; licensee Molecular Diversity Preservation International, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/)
spellingShingle Review
Dao, Vu Truong Son
Etoh, Takeharu Goji
Tanaka, Masatoshi
Nguyen, Hoang Dung
Le Cuong, Vo
Takehara, Kohsei
Akino, Toshiro
Nishi, Kenji
Aoki, Hitoshi
Nakai, Junichi
Toward 100 Mega-Frames per Second: Design of an Ultimate Ultra-High-Speed Image Sensor
title Toward 100 Mega-Frames per Second: Design of an Ultimate Ultra-High-Speed Image Sensor
title_full Toward 100 Mega-Frames per Second: Design of an Ultimate Ultra-High-Speed Image Sensor
title_fullStr Toward 100 Mega-Frames per Second: Design of an Ultimate Ultra-High-Speed Image Sensor
title_full_unstemmed Toward 100 Mega-Frames per Second: Design of an Ultimate Ultra-High-Speed Image Sensor
title_short Toward 100 Mega-Frames per Second: Design of an Ultimate Ultra-High-Speed Image Sensor
title_sort toward 100 mega-frames per second: design of an ultimate ultra-high-speed image sensor
topic Review
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3270825/
https://www.ncbi.nlm.nih.gov/pubmed/22315524
http://dx.doi.org/10.3390/s100100016
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