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Electronic Voltage and Current Transformers Testing Device

A method for testing electronic instrument transformers is described, including electronic voltage and current transformers (EVTs, ECTs) with both analog and digital outputs. A testing device prototype is developed. It is based on digital signal processing of the signals that are measured at the sec...

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Detalles Bibliográficos
Autores principales: Pan, Feng, Chen, Ruimin, Xiao, Yong, Sun, Weiming
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Molecular Diversity Preservation International (MDPI) 2012
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3279254/
https://www.ncbi.nlm.nih.gov/pubmed/22368510
http://dx.doi.org/10.3390/s120101042
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author Pan, Feng
Chen, Ruimin
Xiao, Yong
Sun, Weiming
author_facet Pan, Feng
Chen, Ruimin
Xiao, Yong
Sun, Weiming
author_sort Pan, Feng
collection PubMed
description A method for testing electronic instrument transformers is described, including electronic voltage and current transformers (EVTs, ECTs) with both analog and digital outputs. A testing device prototype is developed. It is based on digital signal processing of the signals that are measured at the secondary outputs of the tested transformer and the reference transformer when the same excitation signal is fed to their primaries. The test that estimates the performance of the prototype has been carried out at the National Centre for High Voltage Measurement and the prototype is approved for testing transformers with precision class up to 0.2 at the industrial frequency (50 Hz or 60 Hz). The device is suitable for on-site testing due to its high accuracy, simple structure and low-cost hardware.
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spelling pubmed-32792542012-02-24 Electronic Voltage and Current Transformers Testing Device Pan, Feng Chen, Ruimin Xiao, Yong Sun, Weiming Sensors (Basel) Article A method for testing electronic instrument transformers is described, including electronic voltage and current transformers (EVTs, ECTs) with both analog and digital outputs. A testing device prototype is developed. It is based on digital signal processing of the signals that are measured at the secondary outputs of the tested transformer and the reference transformer when the same excitation signal is fed to their primaries. The test that estimates the performance of the prototype has been carried out at the National Centre for High Voltage Measurement and the prototype is approved for testing transformers with precision class up to 0.2 at the industrial frequency (50 Hz or 60 Hz). The device is suitable for on-site testing due to its high accuracy, simple structure and low-cost hardware. Molecular Diversity Preservation International (MDPI) 2012-01-18 /pmc/articles/PMC3279254/ /pubmed/22368510 http://dx.doi.org/10.3390/s120101042 Text en © 2012 by the authors; licensee MDPI, Basel, Switzerland This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/).
spellingShingle Article
Pan, Feng
Chen, Ruimin
Xiao, Yong
Sun, Weiming
Electronic Voltage and Current Transformers Testing Device
title Electronic Voltage and Current Transformers Testing Device
title_full Electronic Voltage and Current Transformers Testing Device
title_fullStr Electronic Voltage and Current Transformers Testing Device
title_full_unstemmed Electronic Voltage and Current Transformers Testing Device
title_short Electronic Voltage and Current Transformers Testing Device
title_sort electronic voltage and current transformers testing device
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3279254/
https://www.ncbi.nlm.nih.gov/pubmed/22368510
http://dx.doi.org/10.3390/s120101042
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