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Electronic Voltage and Current Transformers Testing Device
A method for testing electronic instrument transformers is described, including electronic voltage and current transformers (EVTs, ECTs) with both analog and digital outputs. A testing device prototype is developed. It is based on digital signal processing of the signals that are measured at the sec...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Molecular Diversity Preservation International (MDPI)
2012
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3279254/ https://www.ncbi.nlm.nih.gov/pubmed/22368510 http://dx.doi.org/10.3390/s120101042 |
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author | Pan, Feng Chen, Ruimin Xiao, Yong Sun, Weiming |
author_facet | Pan, Feng Chen, Ruimin Xiao, Yong Sun, Weiming |
author_sort | Pan, Feng |
collection | PubMed |
description | A method for testing electronic instrument transformers is described, including electronic voltage and current transformers (EVTs, ECTs) with both analog and digital outputs. A testing device prototype is developed. It is based on digital signal processing of the signals that are measured at the secondary outputs of the tested transformer and the reference transformer when the same excitation signal is fed to their primaries. The test that estimates the performance of the prototype has been carried out at the National Centre for High Voltage Measurement and the prototype is approved for testing transformers with precision class up to 0.2 at the industrial frequency (50 Hz or 60 Hz). The device is suitable for on-site testing due to its high accuracy, simple structure and low-cost hardware. |
format | Online Article Text |
id | pubmed-3279254 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2012 |
publisher | Molecular Diversity Preservation International (MDPI) |
record_format | MEDLINE/PubMed |
spelling | pubmed-32792542012-02-24 Electronic Voltage and Current Transformers Testing Device Pan, Feng Chen, Ruimin Xiao, Yong Sun, Weiming Sensors (Basel) Article A method for testing electronic instrument transformers is described, including electronic voltage and current transformers (EVTs, ECTs) with both analog and digital outputs. A testing device prototype is developed. It is based on digital signal processing of the signals that are measured at the secondary outputs of the tested transformer and the reference transformer when the same excitation signal is fed to their primaries. The test that estimates the performance of the prototype has been carried out at the National Centre for High Voltage Measurement and the prototype is approved for testing transformers with precision class up to 0.2 at the industrial frequency (50 Hz or 60 Hz). The device is suitable for on-site testing due to its high accuracy, simple structure and low-cost hardware. Molecular Diversity Preservation International (MDPI) 2012-01-18 /pmc/articles/PMC3279254/ /pubmed/22368510 http://dx.doi.org/10.3390/s120101042 Text en © 2012 by the authors; licensee MDPI, Basel, Switzerland This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/). |
spellingShingle | Article Pan, Feng Chen, Ruimin Xiao, Yong Sun, Weiming Electronic Voltage and Current Transformers Testing Device |
title | Electronic Voltage and Current Transformers Testing Device |
title_full | Electronic Voltage and Current Transformers Testing Device |
title_fullStr | Electronic Voltage and Current Transformers Testing Device |
title_full_unstemmed | Electronic Voltage and Current Transformers Testing Device |
title_short | Electronic Voltage and Current Transformers Testing Device |
title_sort | electronic voltage and current transformers testing device |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3279254/ https://www.ncbi.nlm.nih.gov/pubmed/22368510 http://dx.doi.org/10.3390/s120101042 |
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