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Fabrication and characterization of well-aligned and ultra-sharp silicon nanotip array
Well-defined, uniform, and large-area nanoscaled tips are of great interest for scanning probe microscopy and high-efficiency field emission. An ultra-sharp nanotip causes higher electrical field and, hence, improves the emission current. In this paper, a large-area and well-aligned ultra-sharp nano...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Springer
2012
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3292956/ https://www.ncbi.nlm.nih.gov/pubmed/22330967 http://dx.doi.org/10.1186/1556-276X-7-120 |