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Quantitative multichannel NC-AFM data analysis of graphene growth on SiC(0001)

Noncontact atomic force microscopy provides access to several complementary signals, such as topography, damping, and contact potential. The traditional presentation of such data sets in adjacent figures or in colour-coded pseudo-three-dimensional plots gives only a qualitative impression. We introd...

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Detalles Bibliográficos
Autores principales:	Held, Christian, Seyller, Thomas, Bennewitz, Roland
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2012
Materias:	Full Research Paper
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3304321/ https://www.ncbi.nlm.nih.gov/pubmed/22428109 http://dx.doi.org/10.3762/bjnano.3.19

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