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Theoretical study of the frequency shift in bimodal FM-AFM by fractional calculus

Bimodal atomic force microscopy is a force-microscopy method that requires the simultaneous excitation of two eigenmodes of the cantilever. This method enables the simultaneous recording of several material properties and, at the same time, it also increases the sensitivity of the microscope. Here w...

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Detalles Bibliográficos
Autores principales:	Herruzo, Elena T, Garcia, Ricardo
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2012
Materias:	Full Research Paper
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3323908/ https://www.ncbi.nlm.nih.gov/pubmed/22496992 http://dx.doi.org/10.3762/bjnano.3.22

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