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Scan speed control for tapping mode SPM

In order to increase the imaging speed of a scanning probe microscope in tapping mode, we propose to use a dynamic controller on 'parachuting' regions. Furthermore, we propose to use variable scan speed on 'upward step' regions, with the speed determined by the error signal of th...

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Detalles Bibliográficos
Autores principales: Meshtcheryakov, Aleksey V, Meshtcheryakov, Vjacheslav V
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2012
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3354338/
https://www.ncbi.nlm.nih.gov/pubmed/22333220
http://dx.doi.org/10.1186/1556-276X-7-121
Descripción
Sumario:In order to increase the imaging speed of a scanning probe microscope in tapping mode, we propose to use a dynamic controller on 'parachuting' regions. Furthermore, we propose to use variable scan speed on 'upward step' regions, with the speed determined by the error signal of the closed-loop control. We offer line traces obtained on a calibration grating with 25-nm step height, using both standard scanning and our scanning method, as experimental evidence.