Cargando…

Humidity-Induced Charge Leakage and Field Attenuation in Electric Field Microsensors

The steady-state zero output of static electric field measuring systems often fluctuates, which is caused mainly by the finite leakage resistance of the water film on the surface of the electric field microsensor package. The water adsorption has been calculated using the Boltzmann distribution equa...

Descripción completa

Detalles Bibliográficos
Autores principales: Zhang, Haiyan, Fang, Dongming, Yang, Pengfei, Peng, Chunrong, Wen, Xiaolong, Xia, Shanhong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Molecular Diversity Preservation International (MDPI) 2012
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3355460/
https://www.ncbi.nlm.nih.gov/pubmed/22666077
http://dx.doi.org/10.3390/s120405105
_version_ 1782233376857522176
author Zhang, Haiyan
Fang, Dongming
Yang, Pengfei
Peng, Chunrong
Wen, Xiaolong
Xia, Shanhong
author_facet Zhang, Haiyan
Fang, Dongming
Yang, Pengfei
Peng, Chunrong
Wen, Xiaolong
Xia, Shanhong
author_sort Zhang, Haiyan
collection PubMed
description The steady-state zero output of static electric field measuring systems often fluctuates, which is caused mainly by the finite leakage resistance of the water film on the surface of the electric field microsensor package. The water adsorption has been calculated using the Boltzmann distribution equation at various relative humidities for borosilicate glass and polytetrafluoroethylene surfaces. At various humidities, water film thickness has been calculated, and the induced charge leakage and field attenuation have been theoretically investigated. Experiments have been performed with microsensors to verify the theoretical predictions and the results are in good agreement.
format Online
Article
Text
id pubmed-3355460
institution National Center for Biotechnology Information
language English
publishDate 2012
publisher Molecular Diversity Preservation International (MDPI)
record_format MEDLINE/PubMed
spelling pubmed-33554602012-06-04 Humidity-Induced Charge Leakage and Field Attenuation in Electric Field Microsensors Zhang, Haiyan Fang, Dongming Yang, Pengfei Peng, Chunrong Wen, Xiaolong Xia, Shanhong Sensors (Basel) Article The steady-state zero output of static electric field measuring systems often fluctuates, which is caused mainly by the finite leakage resistance of the water film on the surface of the electric field microsensor package. The water adsorption has been calculated using the Boltzmann distribution equation at various relative humidities for borosilicate glass and polytetrafluoroethylene surfaces. At various humidities, water film thickness has been calculated, and the induced charge leakage and field attenuation have been theoretically investigated. Experiments have been performed with microsensors to verify the theoretical predictions and the results are in good agreement. Molecular Diversity Preservation International (MDPI) 2012-04-19 /pmc/articles/PMC3355460/ /pubmed/22666077 http://dx.doi.org/10.3390/s120405105 Text en © 2012 by the authors; licensee MDPI, Basel, Switzerland This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/).
spellingShingle Article
Zhang, Haiyan
Fang, Dongming
Yang, Pengfei
Peng, Chunrong
Wen, Xiaolong
Xia, Shanhong
Humidity-Induced Charge Leakage and Field Attenuation in Electric Field Microsensors
title Humidity-Induced Charge Leakage and Field Attenuation in Electric Field Microsensors
title_full Humidity-Induced Charge Leakage and Field Attenuation in Electric Field Microsensors
title_fullStr Humidity-Induced Charge Leakage and Field Attenuation in Electric Field Microsensors
title_full_unstemmed Humidity-Induced Charge Leakage and Field Attenuation in Electric Field Microsensors
title_short Humidity-Induced Charge Leakage and Field Attenuation in Electric Field Microsensors
title_sort humidity-induced charge leakage and field attenuation in electric field microsensors
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3355460/
https://www.ncbi.nlm.nih.gov/pubmed/22666077
http://dx.doi.org/10.3390/s120405105
work_keys_str_mv AT zhanghaiyan humidityinducedchargeleakageandfieldattenuationinelectricfieldmicrosensors
AT fangdongming humidityinducedchargeleakageandfieldattenuationinelectricfieldmicrosensors
AT yangpengfei humidityinducedchargeleakageandfieldattenuationinelectricfieldmicrosensors
AT pengchunrong humidityinducedchargeleakageandfieldattenuationinelectricfieldmicrosensors
AT wenxiaolong humidityinducedchargeleakageandfieldattenuationinelectricfieldmicrosensors
AT xiashanhong humidityinducedchargeleakageandfieldattenuationinelectricfieldmicrosensors