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Thickness dependency of field emission in amorphous and nanostructured carbon thin films

Thickness dependency of the field emission of amorphous and nanostructured carbon thin films has been studied. It is found that in amorphous and carbon films with nanometer-sized sp(2) clusters, the emission does not depend on the film thickness. This further proves that the emission happens from th...

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Detalles Bibliográficos
Autores principales: Shakerzadeh, Maziar, Teo, Edwin Hang Tong, Tay, Beng Kang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2012
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3431989/
https://www.ncbi.nlm.nih.gov/pubmed/22655860
http://dx.doi.org/10.1186/1556-276X-7-286
Descripción
Sumario:Thickness dependency of the field emission of amorphous and nanostructured carbon thin films has been studied. It is found that in amorphous and carbon films with nanometer-sized sp(2) clusters, the emission does not depend on the film thickness. This further proves that the emission happens from the surface sp(2) sites due to large enhancement of electric field on these sites. However, in the case of carbon films with nanocrystals of preferred orientation, the emission strongly depends on the film thickness. sp(2)-bonded nanocrystals have higher aspect ratio in thicker films which in turn results in higher field enhancement and hence easier electron emission.