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Thickness dependency of field emission in amorphous and nanostructured carbon thin films
Thickness dependency of the field emission of amorphous and nanostructured carbon thin films has been studied. It is found that in amorphous and carbon films with nanometer-sized sp(2) clusters, the emission does not depend on the film thickness. This further proves that the emission happens from th...
Autores principales: | Shakerzadeh, Maziar, Teo, Edwin Hang Tong, Tay, Beng Kang |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer
2012
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3431989/ https://www.ncbi.nlm.nih.gov/pubmed/22655860 http://dx.doi.org/10.1186/1556-276X-7-286 |
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