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Automatic hammering of nano-patterns on special polymer film by using a vibrating AFM tip

Complicated nano-patterns with linewidth less than 18 nm can be automatically hammered by using atomic force microscopy (AFM) tip in tapping mode with high speed. In this study, the special sample was thin poly(styrene-ethylene/butylenes-styrene) (SEBS) block copolymer film with hexagonal spherical...

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Detalles Bibliográficos
Autores principales: Hong, Xiaodong, Yang, Yongkang, Wang, You
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2012
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3438037/
https://www.ncbi.nlm.nih.gov/pubmed/22889045
http://dx.doi.org/10.1186/1556-276X-7-456

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