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An Enhanced MEMS Error Modeling Approach Based on Nu-Support Vector Regression
Micro Electro Mechanical System (MEMS)-based inertial sensors have made possible the development of a civilian land vehicle navigation system by offering a low-cost solution. However, the accurate modeling of the MEMS sensor errors is one of the most challenging tasks in the design of low-cost navig...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Molecular Diversity Preservation International (MDPI)
2012
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3444110/ https://www.ncbi.nlm.nih.gov/pubmed/23012552 http://dx.doi.org/10.3390/s120709448 |
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author | Bhatt, Deepak Aggarwal, Priyanka Bhattacharya, Prabir Devabhaktuni, Vijay |
author_facet | Bhatt, Deepak Aggarwal, Priyanka Bhattacharya, Prabir Devabhaktuni, Vijay |
author_sort | Bhatt, Deepak |
collection | PubMed |
description | Micro Electro Mechanical System (MEMS)-based inertial sensors have made possible the development of a civilian land vehicle navigation system by offering a low-cost solution. However, the accurate modeling of the MEMS sensor errors is one of the most challenging tasks in the design of low-cost navigation systems. These sensors exhibit significant errors like biases, drift, noises; which are negligible for higher grade units. Different conventional techniques utilizing the Gauss Markov model and neural network method have been previously utilized to model the errors. However, Gauss Markov model works unsatisfactorily in the case of MEMS units due to the presence of high inherent sensor errors. On the other hand, modeling the random drift utilizing Neural Network (NN) is time consuming, thereby affecting its real-time implementation. We overcome these existing drawbacks by developing an enhanced Support Vector Machine (SVM) based error model. Unlike NN, SVMs do not suffer from local minimisation or over-fitting problems and delivers a reliable global solution. Experimental results proved that the proposed SVM approach reduced the noise standard deviation by 10–35% for gyroscopes and 61–76% for accelerometers. Further, positional error drifts under static conditions improved by 41% and 80% in comparison to NN and GM approaches. |
format | Online Article Text |
id | pubmed-3444110 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2012 |
publisher | Molecular Diversity Preservation International (MDPI) |
record_format | MEDLINE/PubMed |
spelling | pubmed-34441102012-09-25 An Enhanced MEMS Error Modeling Approach Based on Nu-Support Vector Regression Bhatt, Deepak Aggarwal, Priyanka Bhattacharya, Prabir Devabhaktuni, Vijay Sensors (Basel) Article Micro Electro Mechanical System (MEMS)-based inertial sensors have made possible the development of a civilian land vehicle navigation system by offering a low-cost solution. However, the accurate modeling of the MEMS sensor errors is one of the most challenging tasks in the design of low-cost navigation systems. These sensors exhibit significant errors like biases, drift, noises; which are negligible for higher grade units. Different conventional techniques utilizing the Gauss Markov model and neural network method have been previously utilized to model the errors. However, Gauss Markov model works unsatisfactorily in the case of MEMS units due to the presence of high inherent sensor errors. On the other hand, modeling the random drift utilizing Neural Network (NN) is time consuming, thereby affecting its real-time implementation. We overcome these existing drawbacks by developing an enhanced Support Vector Machine (SVM) based error model. Unlike NN, SVMs do not suffer from local minimisation or over-fitting problems and delivers a reliable global solution. Experimental results proved that the proposed SVM approach reduced the noise standard deviation by 10–35% for gyroscopes and 61–76% for accelerometers. Further, positional error drifts under static conditions improved by 41% and 80% in comparison to NN and GM approaches. Molecular Diversity Preservation International (MDPI) 2012-07-09 /pmc/articles/PMC3444110/ /pubmed/23012552 http://dx.doi.org/10.3390/s120709448 Text en © 2012 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/). |
spellingShingle | Article Bhatt, Deepak Aggarwal, Priyanka Bhattacharya, Prabir Devabhaktuni, Vijay An Enhanced MEMS Error Modeling Approach Based on Nu-Support Vector Regression |
title | An Enhanced MEMS Error Modeling Approach Based on Nu-Support Vector Regression |
title_full | An Enhanced MEMS Error Modeling Approach Based on Nu-Support Vector Regression |
title_fullStr | An Enhanced MEMS Error Modeling Approach Based on Nu-Support Vector Regression |
title_full_unstemmed | An Enhanced MEMS Error Modeling Approach Based on Nu-Support Vector Regression |
title_short | An Enhanced MEMS Error Modeling Approach Based on Nu-Support Vector Regression |
title_sort | enhanced mems error modeling approach based on nu-support vector regression |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3444110/ https://www.ncbi.nlm.nih.gov/pubmed/23012552 http://dx.doi.org/10.3390/s120709448 |
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