A hybrid scanning mode for fast scanning ion conductance microscopy (SICM) imaging

We have developed a new method of controlling the pipette for scanning ion conductance microscopy to obtain high-resolution images faster. The method keeps the pipette close to the surface during a single line scan but does not follow the exact surface topography, which is calculated by using the io...

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Detalles Bibliográficos
Autores principales: Zhukov, Alex, Richards, Owen, Ostanin, Victor, Korchev, Yuri, Klenerman, David
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2012
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3462995/
https://www.ncbi.nlm.nih.gov/pubmed/22902298
http://dx.doi.org/10.1016/j.ultramic.2012.06.015

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3462995/
https://www.ncbi.nlm.nih.gov/pubmed/22902298
http://dx.doi.org/10.1016/j.ultramic.2012.06.015

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