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A hybrid scanning mode for fast scanning ion conductance microscopy (SICM) imaging

We have developed a new method of controlling the pipette for scanning ion conductance microscopy to obtain high-resolution images faster. The method keeps the pipette close to the surface during a single line scan but does not follow the exact surface topography, which is calculated by using the io...

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Detalles Bibliográficos
Autores principales:	Zhukov, Alex, Richards, Owen, Ostanin, Victor, Korchev, Yuri, Klenerman, David
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Elsevier 2012
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3462995/ https://www.ncbi.nlm.nih.gov/pubmed/22902298 http://dx.doi.org/10.1016/j.ultramic.2012.06.015

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