Using fixed fiduciary markers for stage drift correction

To measure nanometric features with super-resolution requires that the stage, which holds the sample, be stable to nanometric precision. Herein we introduce a new method that uses conventional equipment, is low cost, and does not require intensive computation. Fiduciary markers of approximately 1 µm...

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Detalles Bibliográficos
Autores principales: Lee, Sang Hak, Baday, Murat, Tjioe, Marco, Simonson, Paul D., Zhang, Ruobing, Cai, En, Selvin, Paul R.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Optical Society of America 2012
Materias:
Research-Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3482917/
https://www.ncbi.nlm.nih.gov/pubmed/22714205
http://dx.doi.org/10.1364/OE.20.012177

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3482917/
https://www.ncbi.nlm.nih.gov/pubmed/22714205
http://dx.doi.org/10.1364/OE.20.012177

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