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Nanoscale electrical property studies of individual GeSi quantum rings by conductive scanning probe microscopy

The nanoscale electrical properties of individual self-assembled GeSi quantum rings (QRs) were studied by scanning probe microscopy-based techniques. The surface potential distributions of individual GeSi QRs are obtained by scanning Kelvin microscopy (SKM). Ring-shaped work function distributions a...

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Detalles Bibliográficos
Autores principales:	Lv, Yi, Cui, Jian, Jiang, Zuimin M, Yang, Xinju
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Springer 2012
Materias:	Nano Express
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3524759/ https://www.ncbi.nlm.nih.gov/pubmed/23194252 http://dx.doi.org/10.1186/1556-276X-7-659

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