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A simultaneous multiple angle-wavelength dispersive X-ray reflectometer using a bent-twisted polychromator crystal
An X-ray reflectometer has been developed, which can simultaneously measure the whole specular X-ray reflectivity curve with no need for rotation of the sample, detector or monochromator crystal during the measurement. A bent-twisted crystal polychromator is used to realise a convergent X-ray beam w...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2013
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3526922/ https://www.ncbi.nlm.nih.gov/pubmed/23254659 http://dx.doi.org/10.1107/S0909049512043415 |