Growth and characterization of thin Cu-phthalocyanine films on MgO(001) layer for organic light-emitting diodes

Surface morphology and thermal stability of Cu-phthalocyanine (CuPc) films grown on an epitaxially grown MgO(001) layer were investigated by using atomic force microscope and X-ray diffractometer. The (002) textured β phase of CuPc films were prepared at room temperature beyond the epitaxial MgO/Fe/...

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Detalles Bibliográficos
Autores principales: Bae, Yu Jeong, Lee, Nyun Jong, Kim, Tae Hee, Cho, Hyunduck, Lee, Changhee, Fleet, Luke, Hirohata, Atsufumi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2012
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3533943/
https://www.ncbi.nlm.nih.gov/pubmed/23181826
http://dx.doi.org/10.1186/1556-276X-7-650
Descripción
Sumario:Surface morphology and thermal stability of Cu-phthalocyanine (CuPc) films grown on an epitaxially grown MgO(001) layer were investigated by using atomic force microscope and X-ray diffractometer. The (002) textured β phase of CuPc films were prepared at room temperature beyond the epitaxial MgO/Fe/MgO(001) buffer layer by the vacuum deposition technique. The CuPc structure remained stable even after post-annealing at 350°C for 1 h under vacuum, which is an important advantage of device fabrication. In order to improve the device performance, we investigated also current-voltage-luminescence characteristics for the new top-emitting organic light-emitting diodes with different thicknesses of CuPc layer.

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