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Perfect anti-reflection from first principles

Reducing unwanted reflections through impedance matching, called anti-reflection, has long been an important challenge in optics and electrical engineering. Beyond trial and error optimization, however, a systematic way to realize anti-reflection is still absent. Here, we report the discovery of an...

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Detalles Bibliográficos
Autores principales: Kim, Kyoung-Ho, Q-Han Park
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2013
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3544011/
https://www.ncbi.nlm.nih.gov/pubmed/23320143
http://dx.doi.org/10.1038/srep01062
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author Kim, Kyoung-Ho
Q-Han Park
author_facet Kim, Kyoung-Ho
Q-Han Park
author_sort Kim, Kyoung-Ho
collection PubMed
description Reducing unwanted reflections through impedance matching, called anti-reflection, has long been an important challenge in optics and electrical engineering. Beyond trial and error optimization, however, a systematic way to realize anti-reflection is still absent. Here, we report the discovery of an analytic solution to this long standing problem. For electromagnetic waves, we find the graded permittivity and permeability that completely remove any given impedance mismatch. We demonstrate that perfect broadband anti-reflection is possible when a dispersive, graded refractive index medium is used for the impedance-matching layer. We also present a design rule for the ultra-thin anti-reflection coating which we confirm experimentally by showing the anti-reflection behavior of an exemplary λ/25-thick coating made of metamaterials. This work opens a new path to anti-reflection applications in optoelectronic device, transmission line and stealth technologies.
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spelling pubmed-35440112013-01-14 Perfect anti-reflection from first principles Kim, Kyoung-Ho Q-Han Park Sci Rep Article Reducing unwanted reflections through impedance matching, called anti-reflection, has long been an important challenge in optics and electrical engineering. Beyond trial and error optimization, however, a systematic way to realize anti-reflection is still absent. Here, we report the discovery of an analytic solution to this long standing problem. For electromagnetic waves, we find the graded permittivity and permeability that completely remove any given impedance mismatch. We demonstrate that perfect broadband anti-reflection is possible when a dispersive, graded refractive index medium is used for the impedance-matching layer. We also present a design rule for the ultra-thin anti-reflection coating which we confirm experimentally by showing the anti-reflection behavior of an exemplary λ/25-thick coating made of metamaterials. This work opens a new path to anti-reflection applications in optoelectronic device, transmission line and stealth technologies. Nature Publishing Group 2013-01-14 /pmc/articles/PMC3544011/ /pubmed/23320143 http://dx.doi.org/10.1038/srep01062 Text en Copyright © 2013, Macmillan Publishers Limited. All rights reserved http://creativecommons.org/licenses/by-nc-nd/3.0/ This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported License. To view a copy of this license, visit http://creativecommons.org/licenses/by-nc-nd/3.0/
spellingShingle Article
Kim, Kyoung-Ho
Q-Han Park
Perfect anti-reflection from first principles
title Perfect anti-reflection from first principles
title_full Perfect anti-reflection from first principles
title_fullStr Perfect anti-reflection from first principles
title_full_unstemmed Perfect anti-reflection from first principles
title_short Perfect anti-reflection from first principles
title_sort perfect anti-reflection from first principles
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3544011/
https://www.ncbi.nlm.nih.gov/pubmed/23320143
http://dx.doi.org/10.1038/srep01062
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