Performance of a semiconductor SPECT system: comparison with a conventional Anger-type SPECT instrument

OBJECTIVE: The performance of a new single photon emission computed tomography (SPECT) scanner with a cadmium-zinc-telluride (CZT) solid-state semiconductor detector (Discovery NM 530c; D530c) was evaluated and compared to a conventional Anger-type SPECT with a dual-detector camera (Infinia). METHOD...

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Detalles Bibliográficos
Autores principales: Takahashi, Yasuyuki, Miyagawa, Masao, Nishiyama, Yoshiko, Ishimura, Hayato, Mochizuki, Teruhito
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer Japan 2012
Materias:
Original Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3549244/
https://www.ncbi.nlm.nih.gov/pubmed/22956363
http://dx.doi.org/10.1007/s12149-012-0653-9

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