Cargando…
Nanoscale optical and electrical characterization of horizontally aligned single-walled carbon nanotubes
During the recent years, a significant amount of research has been performed on single-walled carbon nanotubes (SWCNTs) as a channel material in thin-film transistors (Pham et al. IEEE Trans Nanotechnol 11:44–50, 2012). This has prompted the application of advanced characterization techniques based...
Autores principales: | Rodriguez, Raul D, Toader, Marius, Hermann, Sascha, Sheremet, Evgeniya, Müller, Susanne, Gordan, Ovidiu D, Yu, Haibo, Schulz, Stefan E, Hietschold, Michael, Zahn, Dietrich RT |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer
2012
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3552840/ https://www.ncbi.nlm.nih.gov/pubmed/23259903 http://dx.doi.org/10.1186/1556-276X-7-682 |
Ejemplares similares
-
Temperature-dependent Raman investigation of rolled up InGaAs/GaAs microtubes
por: Rodriguez, Raul D, et al.
Publicado: (2012) -
Conductive AFM for CNT characterization
por: Toader, Marius, et al.
Publicado: (2013) -
Raman scattering of InAs/AlAs quantum dot superlattices grown on (001) and (311)B GaAs surfaces
por: Milekhin, Alexander, et al.
Publicado: (2012) -
Optical properties and bandgap evolution of ALD HfSiO(x) films
por: Yang, Wen, et al.
Publicado: (2015) -
Growth of all-carbon horizontally aligned single-walled carbon nanotubes nucleated from fullerene-based structures
por: Ibrahim, Imad, et al.
Publicado: (2013)