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Advanced atomic force microscopy techniques

Detalles Bibliográficos
Autores principales:	Glatzel, Thilo, Hölscher, Hendrik, Schimmel, Thomas, Baykara, Mehmet Z, Schwarz, Udo D, Garcia, Ricardo
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2012
Materias:	Editorial
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3554267/ https://www.ncbi.nlm.nih.gov/pubmed/23365802 http://dx.doi.org/10.3762/bjnano.3.99

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