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A Stochastic Model for Electron Multiplication Charge-Coupled Devices – From Theory to Practice

Electron multiplication charge-coupled devices (EMCCD) are widely used for photon counting experiments and measurements of low intensity light sources, and are extensively employed in biological fluorescence imaging applications. These devices have a complex statistical behaviour that is often not f...

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Detalles Bibliográficos
Autores principales: Hirsch, Michael, Wareham, Richard J., Martin-Fernandez, Marisa L., Hobson, Michael P., Rolfe, Daniel J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Public Library of Science 2013
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3561409/
https://www.ncbi.nlm.nih.gov/pubmed/23382848
http://dx.doi.org/10.1371/journal.pone.0053671
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author Hirsch, Michael
Wareham, Richard J.
Martin-Fernandez, Marisa L.
Hobson, Michael P.
Rolfe, Daniel J.
author_facet Hirsch, Michael
Wareham, Richard J.
Martin-Fernandez, Marisa L.
Hobson, Michael P.
Rolfe, Daniel J.
author_sort Hirsch, Michael
collection PubMed
description Electron multiplication charge-coupled devices (EMCCD) are widely used for photon counting experiments and measurements of low intensity light sources, and are extensively employed in biological fluorescence imaging applications. These devices have a complex statistical behaviour that is often not fully considered in the analysis of EMCCD data. Robust and optimal analysis of EMCCD images requires an understanding of their noise properties, in particular to exploit fully the advantages of Bayesian and maximum-likelihood analysis techniques, whose value is increasingly recognised in biological imaging for obtaining robust quantitative measurements from challenging data. To improve our own EMCCD analysis and as an effort to aid that of the wider bioimaging community, we present, explain and discuss a detailed physical model for EMCCD noise properties, giving a likelihood function for image counts in each pixel for a given incident intensity, and we explain how to measure the parameters for this model from various calibration images.
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spelling pubmed-35614092013-02-04 A Stochastic Model for Electron Multiplication Charge-Coupled Devices – From Theory to Practice Hirsch, Michael Wareham, Richard J. Martin-Fernandez, Marisa L. Hobson, Michael P. Rolfe, Daniel J. PLoS One Research Article Electron multiplication charge-coupled devices (EMCCD) are widely used for photon counting experiments and measurements of low intensity light sources, and are extensively employed in biological fluorescence imaging applications. These devices have a complex statistical behaviour that is often not fully considered in the analysis of EMCCD data. Robust and optimal analysis of EMCCD images requires an understanding of their noise properties, in particular to exploit fully the advantages of Bayesian and maximum-likelihood analysis techniques, whose value is increasingly recognised in biological imaging for obtaining robust quantitative measurements from challenging data. To improve our own EMCCD analysis and as an effort to aid that of the wider bioimaging community, we present, explain and discuss a detailed physical model for EMCCD noise properties, giving a likelihood function for image counts in each pixel for a given incident intensity, and we explain how to measure the parameters for this model from various calibration images. Public Library of Science 2013-01-31 /pmc/articles/PMC3561409/ /pubmed/23382848 http://dx.doi.org/10.1371/journal.pone.0053671 Text en © 2013 Hirsch et al http://creativecommons.org/licenses/by/4.0/ This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are properly credited.
spellingShingle Research Article
Hirsch, Michael
Wareham, Richard J.
Martin-Fernandez, Marisa L.
Hobson, Michael P.
Rolfe, Daniel J.
A Stochastic Model for Electron Multiplication Charge-Coupled Devices – From Theory to Practice
title A Stochastic Model for Electron Multiplication Charge-Coupled Devices – From Theory to Practice
title_full A Stochastic Model for Electron Multiplication Charge-Coupled Devices – From Theory to Practice
title_fullStr A Stochastic Model for Electron Multiplication Charge-Coupled Devices – From Theory to Practice
title_full_unstemmed A Stochastic Model for Electron Multiplication Charge-Coupled Devices – From Theory to Practice
title_short A Stochastic Model for Electron Multiplication Charge-Coupled Devices – From Theory to Practice
title_sort stochastic model for electron multiplication charge-coupled devices – from theory to practice
topic Research Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3561409/
https://www.ncbi.nlm.nih.gov/pubmed/23382848
http://dx.doi.org/10.1371/journal.pone.0053671
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