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Microstructure and optical properties of Pr(3+)-doped hafnium silicate films

In this study, we report on the evolution of the microstructure and photoluminescence properties of Pr(3+)-doped hafnium silicate thin films as a function of annealing temperature (T(A)). The composition and microstructure of the films were characterized by means of Rutherford backscattering spectro...

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Detalles Bibliográficos
Autores principales:	An, YongTao, Labbé, Christophe, Khomenkova, Larysa, Morales, Magali, Portier, Xavier, Gourbilleau, Fabrice
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Springer 2013
Materias:	Nano Express
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3562245/ https://www.ncbi.nlm.nih.gov/pubmed/23336520 http://dx.doi.org/10.1186/1556-276X-8-43

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