Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor

In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a la...

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Detalles Bibliográficos
Autores principales: Stirling, Julian, Shaw, Gordon A
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2013
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3566854/
https://www.ncbi.nlm.nih.gov/pubmed/23400392
http://dx.doi.org/10.3762/bjnano.4.2
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author Stirling, Julian
Shaw, Gordon A
author_facet Stirling, Julian
Shaw, Gordon A
author_sort Stirling, Julian
collection PubMed
description In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements.
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spelling pubmed-35668542013-02-11 Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor Stirling, Julian Shaw, Gordon A Beilstein J Nanotechnol Full Research Paper In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements. Beilstein-Institut 2013-01-08 /pmc/articles/PMC3566854/ /pubmed/23400392 http://dx.doi.org/10.3762/bjnano.4.2 Text en Copyright © 2013, Stirling and Shaw https://creativecommons.org/licenses/by/2.0https://www.beilstein-journals.org/bjnano/termsThis is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms)
spellingShingle Full Research Paper
Stirling, Julian
Shaw, Gordon A
Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor
title Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor
title_full Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor
title_fullStr Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor
title_full_unstemmed Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor
title_short Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor
title_sort calculation of the effect of tip geometry on noncontact atomic force microscopy using a qplus sensor
topic Full Research Paper
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3566854/
https://www.ncbi.nlm.nih.gov/pubmed/23400392
http://dx.doi.org/10.3762/bjnano.4.2
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