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Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

The noise of the frequency-shift signal Δf in noncontact atomic force microscopy (NC-AFM) consists of cantilever thermal noise, tip–surface-interaction noise and instrumental noise from the detection and signal processing systems. We investigate how the displacement-noise spectral density d(z) at th...

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Detalles Bibliográficos
Autores principales:	Lübbe, Jannis, Temmen, Matthias, Rode, Sebastian, Rahe, Philipp, Kühnle, Angelika, Reichling, Michael
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2013
Materias:	Full Research Paper
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3566860/ https://www.ncbi.nlm.nih.gov/pubmed/23400758 http://dx.doi.org/10.3762/bjnano.4.4

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