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Strength, Hardening, and Failure Observed by In Situ TEM Tensile Testing**

We present in situ transmission electron microscope tensile tests on focused ion beam fabricated single and multiple slip oriented Cu tensile samples with thicknesses in the range of 100–200 nm. Both crystal orientations fail by localized shear. While failure occurs after a few percent plastic strai...

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Detalles Bibliográficos
Autores principales:	Kiener, Daniel, Kaufmann, Petra, Minor, Andrew M.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	WILEY-VCH Verlag 2012
Materias:	Communications
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3573867/ https://www.ncbi.nlm.nih.gov/pubmed/23447712 http://dx.doi.org/10.1002/adem.201200031

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