Moiré pattern from a multiple Bragg–Laue interferometer

In X-ray section topography of Si 220 diffraction in a multiple Bragg–Laue mode, a moiré pattern is observed when the incident beam is divided into two parts by inserting a platinum wire in the middle of the beam. The moiré pattern can be explained by the summation of two interference fringes corres...

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Detalles Bibliográficos
Autores principales: Hirano, Kenji, Fukamachi, Tomoe, Kanematsu, Yoshinobu, Jongsukswat, Sukswat, Negishi, Riichirou, Ju, Dongying, Hirano, Keiichi, Kawamura, Takaaki
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2012
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3583625/
https://www.ncbi.nlm.nih.gov/pubmed/22186650
http://dx.doi.org/10.1107/S0909049511047078
Descripción
Sumario:In X-ray section topography of Si 220 diffraction in a multiple Bragg–Laue mode, a moiré pattern is observed when the incident beam is divided into two parts by inserting a platinum wire in the middle of the beam. The moiré pattern can be explained by the summation of two interference fringes corresponding to the two incident beams. The coherency of the X-rays from the bending-magnet beamline is estimated using the moiré pattern.

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