A webcam in Bayer-mode as a light beam profiler for the near infra-red

Beam profiles are commonly measured with complementary metal oxide semiconductors (CMOS) or charge coupled devices (CCD). The devices are fast and reliable but expensive. By making use of the fact that the Bayer-filter in commercial webcams is transparent in the near infra-red (>800 nm) and their...

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Detalles Bibliográficos
Autores principales: Langer, Gregor, Hochreiner, Armin, Burgholzer, Peter, Berer, Thomas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Applied Science Publishers 2013
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3584619/
https://www.ncbi.nlm.nih.gov/pubmed/23645943
http://dx.doi.org/10.1016/j.optlaseng.2012.12.010
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author Langer, Gregor
Hochreiner, Armin
Burgholzer, Peter
Berer, Thomas
author_facet Langer, Gregor
Hochreiner, Armin
Burgholzer, Peter
Berer, Thomas
author_sort Langer, Gregor
collection PubMed
description Beam profiles are commonly measured with complementary metal oxide semiconductors (CMOS) or charge coupled devices (CCD). The devices are fast and reliable but expensive. By making use of the fact that the Bayer-filter in commercial webcams is transparent in the near infra-red (>800 nm) and their CCD chips are sensitive up to about 1100 nm, we demonstrate a cheap and simple way to measure laser beam profiles with a resolution down to around ±1 μm, which is close to the resolution of the knife-edge technique.
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spelling pubmed-35846192013-05-01 A webcam in Bayer-mode as a light beam profiler for the near infra-red Langer, Gregor Hochreiner, Armin Burgholzer, Peter Berer, Thomas Opt Lasers Eng Article Beam profiles are commonly measured with complementary metal oxide semiconductors (CMOS) or charge coupled devices (CCD). The devices are fast and reliable but expensive. By making use of the fact that the Bayer-filter in commercial webcams is transparent in the near infra-red (>800 nm) and their CCD chips are sensitive up to about 1100 nm, we demonstrate a cheap and simple way to measure laser beam profiles with a resolution down to around ±1 μm, which is close to the resolution of the knife-edge technique. Applied Science Publishers 2013-05 /pmc/articles/PMC3584619/ /pubmed/23645943 http://dx.doi.org/10.1016/j.optlaseng.2012.12.010 Text en © 2013 Elsevier Ltd. https://creativecommons.org/licenses/by-nc-nd/3.0/ Open Access under CC BY-NC-ND 3.0 (https://creativecommons.org/licenses/by-nc-nd/3.0/) license
spellingShingle Article
Langer, Gregor
Hochreiner, Armin
Burgholzer, Peter
Berer, Thomas
A webcam in Bayer-mode as a light beam profiler for the near infra-red
title A webcam in Bayer-mode as a light beam profiler for the near infra-red
title_full A webcam in Bayer-mode as a light beam profiler for the near infra-red
title_fullStr A webcam in Bayer-mode as a light beam profiler for the near infra-red
title_full_unstemmed A webcam in Bayer-mode as a light beam profiler for the near infra-red
title_short A webcam in Bayer-mode as a light beam profiler for the near infra-red
title_sort webcam in bayer-mode as a light beam profiler for the near infra-red
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3584619/
https://www.ncbi.nlm.nih.gov/pubmed/23645943
http://dx.doi.org/10.1016/j.optlaseng.2012.12.010
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