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Initial Steps of Rubicene Film Growth on Silicon Dioxide

[Image: see text] The film growth of the conjugated organic molecule rubicene on silicon dioxide was studied in detail. Since no structural data of the condensed material were available, we first produced high quality single crystals from solution and determined the crystal structure. This high puri...

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Autores principales: Scherwitzl, Boris, Lukesch, Walter, Hirzer, Andreas, Albering, Jörg, Leising, Günther, Resel, Roland, Winkler, Adolf
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2013
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3589099/
https://www.ncbi.nlm.nih.gov/pubmed/23476720
http://dx.doi.org/10.1021/jp3122598
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author Scherwitzl, Boris
Lukesch, Walter
Hirzer, Andreas
Albering, Jörg
Leising, Günther
Resel, Roland
Winkler, Adolf
author_facet Scherwitzl, Boris
Lukesch, Walter
Hirzer, Andreas
Albering, Jörg
Leising, Günther
Resel, Roland
Winkler, Adolf
author_sort Scherwitzl, Boris
collection PubMed
description [Image: see text] The film growth of the conjugated organic molecule rubicene on silicon dioxide was studied in detail. Since no structural data of the condensed material were available, we first produced high quality single crystals from solution and determined the crystal structure. This high purity material was used to prepare ultrathin films under ultrahigh vacuum conditions, by physical vapor deposition. Thermal desorption spectroscopy (TDS) was applied to delineate the adsorption and desorption kinetics. It could be shown that the initial sticking coefficient is only 0.2 ± 0.05, but the sticking coefficient increases with increasing coverage. TDS further revealed that first a closed, weakly bound bilayer develops (wetting layer), which dewets after further deposition of rubicene, leading to an island-like layer. These islands are crystalline and exhibit the same structure as the solution grown crystals. The orientation of the crystallites is with the (001) plane parallel to the substrate. A dewetting of the closed bilayer was also observed when the film was exposed to air. Furthermore, Ostwald ripening of the island-like film takes place under ambient conditions, leading to films composed of few, large crystallites. From TDS, we determined the heat of evaporation from the multilayer islands to be 1.47 eV, whereas the desorption energy from the first layer is only 1.25 eV.
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spelling pubmed-35890992013-03-06 Initial Steps of Rubicene Film Growth on Silicon Dioxide Scherwitzl, Boris Lukesch, Walter Hirzer, Andreas Albering, Jörg Leising, Günther Resel, Roland Winkler, Adolf J Phys Chem C Nanomater Interfaces [Image: see text] The film growth of the conjugated organic molecule rubicene on silicon dioxide was studied in detail. Since no structural data of the condensed material were available, we first produced high quality single crystals from solution and determined the crystal structure. This high purity material was used to prepare ultrathin films under ultrahigh vacuum conditions, by physical vapor deposition. Thermal desorption spectroscopy (TDS) was applied to delineate the adsorption and desorption kinetics. It could be shown that the initial sticking coefficient is only 0.2 ± 0.05, but the sticking coefficient increases with increasing coverage. TDS further revealed that first a closed, weakly bound bilayer develops (wetting layer), which dewets after further deposition of rubicene, leading to an island-like layer. These islands are crystalline and exhibit the same structure as the solution grown crystals. The orientation of the crystallites is with the (001) plane parallel to the substrate. A dewetting of the closed bilayer was also observed when the film was exposed to air. Furthermore, Ostwald ripening of the island-like film takes place under ambient conditions, leading to films composed of few, large crystallites. From TDS, we determined the heat of evaporation from the multilayer islands to be 1.47 eV, whereas the desorption energy from the first layer is only 1.25 eV. American Chemical Society 2013-01-31 2013-02-28 /pmc/articles/PMC3589099/ /pubmed/23476720 http://dx.doi.org/10.1021/jp3122598 Text en Copyright © 2013 American Chemical Society Terms of Use (http://pubs.acs.org/page/policy/authorchoice_termsofuse.html)
spellingShingle Scherwitzl, Boris
Lukesch, Walter
Hirzer, Andreas
Albering, Jörg
Leising, Günther
Resel, Roland
Winkler, Adolf
Initial Steps of Rubicene Film Growth on Silicon Dioxide
title Initial Steps of Rubicene Film Growth on Silicon Dioxide
title_full Initial Steps of Rubicene Film Growth on Silicon Dioxide
title_fullStr Initial Steps of Rubicene Film Growth on Silicon Dioxide
title_full_unstemmed Initial Steps of Rubicene Film Growth on Silicon Dioxide
title_short Initial Steps of Rubicene Film Growth on Silicon Dioxide
title_sort initial steps of rubicene film growth on silicon dioxide
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3589099/
https://www.ncbi.nlm.nih.gov/pubmed/23476720
http://dx.doi.org/10.1021/jp3122598
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