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Automated Transmission-Mode Scanning Electron Microscopy (tSEM) for Large Volume Analysis at Nanoscale Resolution

Transmission-mode scanning electron microscopy (tSEM) on a field emission SEM platform was developed for efficient and cost-effective imaging of circuit-scale volumes from brain at nanoscale resolution. Image area was maximized while optimizing the resolution and dynamic range necessary for discrimi...

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Detalles Bibliográficos
Autores principales:	Kuwajima, Masaaki, Mendenhall, John M., Lindsey, Laurence F., Harris, Kristen M.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Public Library of Science 2013
Materias:	Research Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3608656/ https://www.ncbi.nlm.nih.gov/pubmed/23555711 http://dx.doi.org/10.1371/journal.pone.0059573

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