Full spatial characterization of a nanofocused x-ray free-electron laser beam by ptychographic imaging

The emergence of hard X-ray free electron lasers (XFELs) enables new insights into many fields of science. These new sources provide short, highly intense, and coherent X-ray pulses. In a variety of scientific applications these pulses need to be strongly focused. In this article, we demonstrate foc...

Descripción completa

Detalles Bibliográficos
Autores principales: Schropp, Andreas, Hoppe, Robert, Meier, Vivienne, Patommel, Jens, Seiboth, Frank, Lee, Hae Ja, Nagler, Bob, Galtier, Eric C., Arnold, Brice, Zastrau, Ulf, Hastings, Jerome B., Nilsson, Daniel, Uhlén, Fredrik, Vogt, Ulrich, Hertz, Hans M., Schroer, Christian G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2013
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3620670/
https://www.ncbi.nlm.nih.gov/pubmed/23567281
http://dx.doi.org/10.1038/srep01633

Ejemplares similares

Ejemplares similares