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Scaling Properties of Charge Transport in Polycrystalline Graphene

[Image: see text] Polycrystalline graphene is a patchwork of coalescing graphene grains of varying lattice orientations and size, resulting from the chemical vapor deposition (CVD) growth at random nucleation sites on metallic substrates. The morphology of grain boundaries has become an important to...

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Autores principales: Van Tuan, Dinh, Kotakoski, Jani, Louvet, Thibaud, Ortmann, Frank, Meyer, Jannik C., Roche, Stephan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2013
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3638495/
https://www.ncbi.nlm.nih.gov/pubmed/23448361
http://dx.doi.org/10.1021/nl400321r
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author Van Tuan, Dinh
Kotakoski, Jani
Louvet, Thibaud
Ortmann, Frank
Meyer, Jannik C.
Roche, Stephan
author_facet Van Tuan, Dinh
Kotakoski, Jani
Louvet, Thibaud
Ortmann, Frank
Meyer, Jannik C.
Roche, Stephan
author_sort Van Tuan, Dinh
collection PubMed
description [Image: see text] Polycrystalline graphene is a patchwork of coalescing graphene grains of varying lattice orientations and size, resulting from the chemical vapor deposition (CVD) growth at random nucleation sites on metallic substrates. The morphology of grain boundaries has become an important topic given its fundamental role in limiting the mobility of charge carriers in polycrystalline graphene, as compared to mechanically exfoliated samples. Here we report new insights to the current understanding of charge transport in polycrystalline geometries. We created realistic models of large CVD-grown graphene samples and then computed the corresponding charge carrier mobilities as a function of the average grain size and the coalescence quality between the grains. Our results reveal a remarkably simple scaling law for the mean free path and conductivity, correlated to atomic-scale charge density fluctuations along grain boundaries.
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spelling pubmed-36384952013-04-29 Scaling Properties of Charge Transport in Polycrystalline Graphene Van Tuan, Dinh Kotakoski, Jani Louvet, Thibaud Ortmann, Frank Meyer, Jannik C. Roche, Stephan Nano Lett [Image: see text] Polycrystalline graphene is a patchwork of coalescing graphene grains of varying lattice orientations and size, resulting from the chemical vapor deposition (CVD) growth at random nucleation sites on metallic substrates. The morphology of grain boundaries has become an important topic given its fundamental role in limiting the mobility of charge carriers in polycrystalline graphene, as compared to mechanically exfoliated samples. Here we report new insights to the current understanding of charge transport in polycrystalline geometries. We created realistic models of large CVD-grown graphene samples and then computed the corresponding charge carrier mobilities as a function of the average grain size and the coalescence quality between the grains. Our results reveal a remarkably simple scaling law for the mean free path and conductivity, correlated to atomic-scale charge density fluctuations along grain boundaries. American Chemical Society 2013-02-28 2013-04-10 /pmc/articles/PMC3638495/ /pubmed/23448361 http://dx.doi.org/10.1021/nl400321r Text en Copyright © 2013 American Chemical Society Terms of Use (http://pubs.acs.org/page/policy/authorchoice_termsofuse.html)
spellingShingle Van Tuan, Dinh
Kotakoski, Jani
Louvet, Thibaud
Ortmann, Frank
Meyer, Jannik C.
Roche, Stephan
Scaling Properties of Charge Transport in Polycrystalline Graphene
title Scaling Properties of Charge Transport in Polycrystalline Graphene
title_full Scaling Properties of Charge Transport in Polycrystalline Graphene
title_fullStr Scaling Properties of Charge Transport in Polycrystalline Graphene
title_full_unstemmed Scaling Properties of Charge Transport in Polycrystalline Graphene
title_short Scaling Properties of Charge Transport in Polycrystalline Graphene
title_sort scaling properties of charge transport in polycrystalline graphene
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3638495/
https://www.ncbi.nlm.nih.gov/pubmed/23448361
http://dx.doi.org/10.1021/nl400321r
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