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Development and applications of a new neutron single-crystal diffractometer based on a two-dimensional large-area curved position-sensitive detector

A new single-crystal neutron diffractometer based on a large-area curved two-dimensional position-sensitive detector (C-2DPSD) has been developed. The diffractometer commissioning is almost complete, together with development of the measurement methodology and the raw data processing software packag...

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Detalles Bibliográficos
Autores principales: Lee, Chang-Hee, Noda, Yukio, Ishikawa, Yoshihisa, Kim, Shin Ae, Moon, Myungkook, Kimura, Hiroyuki, Watanabe, Masashi, Dohi, Yuki
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2013
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3654314/
https://www.ncbi.nlm.nih.gov/pubmed/23682194
http://dx.doi.org/10.1107/S002188981300681X
Descripción
Sumario:A new single-crystal neutron diffractometer based on a large-area curved two-dimensional position-sensitive detector (C-2DPSD) has been developed. The diffractometer commissioning is almost complete, together with development of the measurement methodology and the raw data processing software package, the Reciprocal Analyzer, and the instrument is now ready to be launched for users. Position decoding of the C-2DPSD is via a delay-line readout method with an effective angular range of 110 × 54° in the horizontal and vertical directions, respectively, with a nominal radius of curvature of 530 mm. The diffractometer is equipped with a Ge(311) mosaic monochromator and two supermirror vacuum guide paths, one before and one after the monochromator position. The commissioning incorporates corrections and calibration of the instrument using an NaCl crystal, various applications such as crystallographic and magnetic structure measurements, a crystallinity check on large crystals, and a study on the composition or dopant content of a mixed crystal of (Tm(x)Yb(1−x))Mn(2)O(5). The installation of the diffractometer and the measurement method, the calibration procedure and results, the raw data treatment and visualization, and several applications using the large C-2DPSD-based diffractometer are reported.