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A Perturbation Method for the 3D Finite Element Modeling of Electrostatically Driven MEMS

In this paper, a finite element (FE) procedure for modeling electrostatically actuated MEMS is presented. It concerns a perturbation method for computing electrostatic field distortions due to moving conductors. The computation is split in two steps. First, an unperturbed problem (in the absence of...

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Detalles Bibliográficos
Autores principales: Boutaayamou, Mohamed, Sabariego, Ruth V., Dular, Patrick
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Molecular Diversity Preservation International (MDPI) 2008
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3673000/
https://www.ncbi.nlm.nih.gov/pubmed/27879748
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author Boutaayamou, Mohamed
Sabariego, Ruth V.
Dular, Patrick
author_facet Boutaayamou, Mohamed
Sabariego, Ruth V.
Dular, Patrick
author_sort Boutaayamou, Mohamed
collection PubMed
description In this paper, a finite element (FE) procedure for modeling electrostatically actuated MEMS is presented. It concerns a perturbation method for computing electrostatic field distortions due to moving conductors. The computation is split in two steps. First, an unperturbed problem (in the absence of certain conductors) is solved with the conventional FE method in the complete domain. Second, a perturbation problem is solved in a reduced region with an additional conductor using the solution of the unperturbed problem as a source. When the perturbing region is close to the original source field, an iterative computation may be required. The developed procedure offers the advantage of solving sub-problems in reduced domains and consequently of benefiting from different problem-adapted meshes. This approach allows for computational efficiency by decreasing the size of the problem.
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spelling pubmed-36730002013-06-12 A Perturbation Method for the 3D Finite Element Modeling of Electrostatically Driven MEMS Boutaayamou, Mohamed Sabariego, Ruth V. Dular, Patrick Sensors (Basel) Full Paper In this paper, a finite element (FE) procedure for modeling electrostatically actuated MEMS is presented. It concerns a perturbation method for computing electrostatic field distortions due to moving conductors. The computation is split in two steps. First, an unperturbed problem (in the absence of certain conductors) is solved with the conventional FE method in the complete domain. Second, a perturbation problem is solved in a reduced region with an additional conductor using the solution of the unperturbed problem as a source. When the perturbing region is close to the original source field, an iterative computation may be required. The developed procedure offers the advantage of solving sub-problems in reduced domains and consequently of benefiting from different problem-adapted meshes. This approach allows for computational efficiency by decreasing the size of the problem. Molecular Diversity Preservation International (MDPI) 2008-02-19 /pmc/articles/PMC3673000/ /pubmed/27879748 Text en © 2008 by MDPI Reproduction is permitted for noncommercial purposes.
spellingShingle Full Paper
Boutaayamou, Mohamed
Sabariego, Ruth V.
Dular, Patrick
A Perturbation Method for the 3D Finite Element Modeling of Electrostatically Driven MEMS
title A Perturbation Method for the 3D Finite Element Modeling of Electrostatically Driven MEMS
title_full A Perturbation Method for the 3D Finite Element Modeling of Electrostatically Driven MEMS
title_fullStr A Perturbation Method for the 3D Finite Element Modeling of Electrostatically Driven MEMS
title_full_unstemmed A Perturbation Method for the 3D Finite Element Modeling of Electrostatically Driven MEMS
title_short A Perturbation Method for the 3D Finite Element Modeling of Electrostatically Driven MEMS
title_sort perturbation method for the 3d finite element modeling of electrostatically driven mems
topic Full Paper
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3673000/
https://www.ncbi.nlm.nih.gov/pubmed/27879748
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