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A Perturbation Method for the 3D Finite Element Modeling of Electrostatically Driven MEMS
In this paper, a finite element (FE) procedure for modeling electrostatically actuated MEMS is presented. It concerns a perturbation method for computing electrostatic field distortions due to moving conductors. The computation is split in two steps. First, an unperturbed problem (in the absence of...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Molecular Diversity Preservation International (MDPI)
2008
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3673000/ https://www.ncbi.nlm.nih.gov/pubmed/27879748 |
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author | Boutaayamou, Mohamed Sabariego, Ruth V. Dular, Patrick |
author_facet | Boutaayamou, Mohamed Sabariego, Ruth V. Dular, Patrick |
author_sort | Boutaayamou, Mohamed |
collection | PubMed |
description | In this paper, a finite element (FE) procedure for modeling electrostatically actuated MEMS is presented. It concerns a perturbation method for computing electrostatic field distortions due to moving conductors. The computation is split in two steps. First, an unperturbed problem (in the absence of certain conductors) is solved with the conventional FE method in the complete domain. Second, a perturbation problem is solved in a reduced region with an additional conductor using the solution of the unperturbed problem as a source. When the perturbing region is close to the original source field, an iterative computation may be required. The developed procedure offers the advantage of solving sub-problems in reduced domains and consequently of benefiting from different problem-adapted meshes. This approach allows for computational efficiency by decreasing the size of the problem. |
format | Online Article Text |
id | pubmed-3673000 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2008 |
publisher | Molecular Diversity Preservation International (MDPI) |
record_format | MEDLINE/PubMed |
spelling | pubmed-36730002013-06-12 A Perturbation Method for the 3D Finite Element Modeling of Electrostatically Driven MEMS Boutaayamou, Mohamed Sabariego, Ruth V. Dular, Patrick Sensors (Basel) Full Paper In this paper, a finite element (FE) procedure for modeling electrostatically actuated MEMS is presented. It concerns a perturbation method for computing electrostatic field distortions due to moving conductors. The computation is split in two steps. First, an unperturbed problem (in the absence of certain conductors) is solved with the conventional FE method in the complete domain. Second, a perturbation problem is solved in a reduced region with an additional conductor using the solution of the unperturbed problem as a source. When the perturbing region is close to the original source field, an iterative computation may be required. The developed procedure offers the advantage of solving sub-problems in reduced domains and consequently of benefiting from different problem-adapted meshes. This approach allows for computational efficiency by decreasing the size of the problem. Molecular Diversity Preservation International (MDPI) 2008-02-19 /pmc/articles/PMC3673000/ /pubmed/27879748 Text en © 2008 by MDPI Reproduction is permitted for noncommercial purposes. |
spellingShingle | Full Paper Boutaayamou, Mohamed Sabariego, Ruth V. Dular, Patrick A Perturbation Method for the 3D Finite Element Modeling of Electrostatically Driven MEMS |
title | A Perturbation Method for the 3D Finite Element Modeling of Electrostatically Driven MEMS |
title_full | A Perturbation Method for the 3D Finite Element Modeling of Electrostatically Driven MEMS |
title_fullStr | A Perturbation Method for the 3D Finite Element Modeling of Electrostatically Driven MEMS |
title_full_unstemmed | A Perturbation Method for the 3D Finite Element Modeling of Electrostatically Driven MEMS |
title_short | A Perturbation Method for the 3D Finite Element Modeling of Electrostatically Driven MEMS |
title_sort | perturbation method for the 3d finite element modeling of electrostatically driven mems |
topic | Full Paper |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3673000/ https://www.ncbi.nlm.nih.gov/pubmed/27879748 |
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