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A nanometre-scale resolution interference-based probe of interfacial phenomena between microscopic objects and surfaces
Interferometric techniques have proven useful to infer proximity and local surface profiles of microscopic objects near surfaces. But a critical trade-off emerges between accuracy and mathematical complexity when these methods are applied outside the vicinity of closest approach. Here we introduce a...
Autores principales: | Contreras-Naranjo, Jose C., Ugaz, Victor M. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Pub. Group
2013
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3675327/ https://www.ncbi.nlm.nih.gov/pubmed/23715278 http://dx.doi.org/10.1038/ncomms2865 |
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