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High-resolution electrical and chemical characterization of nm-scale organic and inorganic devices

Detalles Bibliográficos
Autor principal:	Eyben, Pierre
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein-Institut 2013
Materias:	Editorial
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3678427/ https://www.ncbi.nlm.nih.gov/pubmed/23766955 http://dx.doi.org/10.3762/bjnano.4.35

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