Integrated nonlinear optical imaging microscope for on-axis crystal detection and centering at a synchrotron beamline

Nonlinear optical (NLO) instrumentation has been integrated with synchrotron X-ray diffraction (XRD) for combined single-platform analysis, initially targeting applications for automated crystal centering. Second-harmonic-generation microscopy and two-photon-excited ultraviolet fluorescence microsco...

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Detalles Bibliográficos
Autores principales: Madden, Jeremy T., Toth, Scott J., Dettmar, Christopher M., Newman, Justin A., Oglesbee, Robert A., Hedderich, Hartmut G., Everly, R. Michael, Becker, Michael, Ronau, Judith A., Buchanan, Susan K., Cherezov, Vadim, Morrow, Marie E., Xu, Shenglan, Ferguson, Dale, Makarov, Oleg, Das, Chittaranjan, Fischetti, Robert, Simpson, Garth J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2013
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3682636/
https://www.ncbi.nlm.nih.gov/pubmed/23765294
http://dx.doi.org/10.1107/S0909049513007942

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