Enhancing Secondary Ion Yields in Time of Flight-Secondary Ion Mass Spectrometry Using Water Cluster Primary Beams

[Image: see text] Low secondary ion yields from organic and biological molecules are the principal limitation on the future exploitation of time of flight-secondary ion mass spectrometry (TOF-SIMS) as a surface and materials analysis technique. On the basis of the hypothesis that increasing the dens...

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Detalles Bibliográficos
Autores principales: Sheraz née Rabbani, Sadia, Barber, Andrew, Fletcher, John S., Lockyer, Nicholas P., Vickerman, John C.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2013
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3686110/
https://www.ncbi.nlm.nih.gov/pubmed/23718847
http://dx.doi.org/10.1021/ac4013732

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