Dependencies of microstructure and stress on the thickness of GdBa(2)Cu(3)O(7 − δ) thin films fabricated by RF sputtering

GdBa(2)Cu(3)O(7 − δ) (GdBCO) films with different thicknesses from 200 to 2,100 nm are deposited on CeO(2)/yttria-stabilized zirconia (YSZ)/CeO(2)-buffered Ni-W substrates by radio-frequency magnetron sputtering. Both the X-ray diffraction and scanning electron microscopy analyses reveal that the a-...

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Detalles Bibliográficos
Autores principales: Wang, Ying, Xu, Da, Li, Yijie, Liu, Linfei
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2013
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3716989/
https://www.ncbi.nlm.nih.gov/pubmed/23816137
http://dx.doi.org/10.1186/1556-276X-8-304

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3716989/
https://www.ncbi.nlm.nih.gov/pubmed/23816137
http://dx.doi.org/10.1186/1556-276X-8-304

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