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Dependencies of microstructure and stress on the thickness of GdBa(2)Cu(3)O(7 − δ) thin films fabricated by RF sputtering

GdBa(2)Cu(3)O(7 − δ) (GdBCO) films with different thicknesses from 200 to 2,100 nm are deposited on CeO(2)/yttria-stabilized zirconia (YSZ)/CeO(2)-buffered Ni-W substrates by radio-frequency magnetron sputtering. Both the X-ray diffraction and scanning electron microscopy analyses reveal that the a-...

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Detalles Bibliográficos
Autores principales:	Wang, Ying, Xu, Da, Li, Yijie, Liu, Linfei
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Springer 2013
Materias:	Nano Express
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3716989/ https://www.ncbi.nlm.nih.gov/pubmed/23816137 http://dx.doi.org/10.1186/1556-276X-8-304

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