Free-field characterization via directional transmission through a nanoaperture

We propose a scheme based on extraordinary transmission of light through a single nanoaperture, surrounded by periodic corrugations, for direct characterization of focal-region optical fields with subwavelength-scale structure. We describe the design of the device on the basis of rigorous diffraction theory and fabricate a prototype using a process that involves electron beam lithography, dry etching, and template stripping. First experimental results performed with a transmission-type confocal optical microscope demonstrate the potential of the method.