Semi-transparent central stop in high-resolution X-ray ptychography using Kirkpatrick–Baez focusing

A ptychographic coherent X-ray diffractive imaging (PCDI) experiment has been carried out using 7.9 keV X-rays and Kirkpatrick–Baez focusing mirrors. By introducing a semi-transparent central stop in front of the detector the dynamic range on the detector is increased by about four orders of magnitu...

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Detalles Bibliográficos
Autores principales: Wilke, R. N., Vassholz, M., Salditt, T.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2013
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3744854/
http://dx.doi.org/10.1107/S0108767313019612
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author Wilke, R. N.
Vassholz, M.
Salditt, T.
author_facet Wilke, R. N.
Vassholz, M.
Salditt, T.
author_sort Wilke, R. N.
collection PubMed
description A ptychographic coherent X-ray diffractive imaging (PCDI) experiment has been carried out using 7.9 keV X-rays and Kirkpatrick–Baez focusing mirrors. By introducing a semi-transparent central stop in front of the detector the dynamic range on the detector is increased by about four orders of magnitude. The feasibility of this experimental scheme is demonstrated for PCDI applications with a resolution below 10 nm. The results are compared with reference data and an increase of resolution by a factor of two is obtained, while the deviation of the reconstructed phase map from the reference is below 1%.
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spelling pubmed-37448542013-08-21 Semi-transparent central stop in high-resolution X-ray ptychography using Kirkpatrick–Baez focusing Wilke, R. N. Vassholz, M. Salditt, T. Acta Crystallogr A Research Papers A ptychographic coherent X-ray diffractive imaging (PCDI) experiment has been carried out using 7.9 keV X-rays and Kirkpatrick–Baez focusing mirrors. By introducing a semi-transparent central stop in front of the detector the dynamic range on the detector is increased by about four orders of magnitude. The feasibility of this experimental scheme is demonstrated for PCDI applications with a resolution below 10 nm. The results are compared with reference data and an increase of resolution by a factor of two is obtained, while the deviation of the reconstructed phase map from the reference is below 1%. International Union of Crystallography 2013-09-01 2013-08-14 /pmc/articles/PMC3744854/ http://dx.doi.org/10.1107/S0108767313019612 Text en © R. N. Wilke et al. 2013 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle Research Papers
Wilke, R. N.
Vassholz, M.
Salditt, T.
Semi-transparent central stop in high-resolution X-ray ptychography using Kirkpatrick–Baez focusing
title Semi-transparent central stop in high-resolution X-ray ptychography using Kirkpatrick–Baez focusing
title_full Semi-transparent central stop in high-resolution X-ray ptychography using Kirkpatrick–Baez focusing
title_fullStr Semi-transparent central stop in high-resolution X-ray ptychography using Kirkpatrick–Baez focusing
title_full_unstemmed Semi-transparent central stop in high-resolution X-ray ptychography using Kirkpatrick–Baez focusing
title_short Semi-transparent central stop in high-resolution X-ray ptychography using Kirkpatrick–Baez focusing
title_sort semi-transparent central stop in high-resolution x-ray ptychography using kirkpatrick–baez focusing
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3744854/
http://dx.doi.org/10.1107/S0108767313019612
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AT vassholzm semitransparentcentralstopinhighresolutionxrayptychographyusingkirkpatrickbaezfocusing
AT saldittt semitransparentcentralstopinhighresolutionxrayptychographyusingkirkpatrickbaezfocusing

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