Modified statistical dynamical diffraction theory: analysis of model SiGe heterostructures

A modified version of the statistical dynamical diffraction theory (mSDDT) permits full-pattern fitting of high-resolution X-ray diffraction scans from thin-film systems across the entire range from fully dynamic to fully kinematic scattering. The mSDDT analysis has been applied to a set of model Si...

Descripción completa

Detalles Bibliográficos
Autores principales: Shreeman, P. K., Dunn, K. A., Novak, S. W., Matyi, R. J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2013
Materias:
X-Ray Diffraction and Imaging
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3769062/
https://www.ncbi.nlm.nih.gov/pubmed/24046498
http://dx.doi.org/10.1107/S0021889813011308

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3769062/
https://www.ncbi.nlm.nih.gov/pubmed/24046498
http://dx.doi.org/10.1107/S0021889813011308

Ejemplares similares