Cargando…
Alloy formation during molecular beam epitaxy growth of Si-doped InAs nanowires on GaAs[111]B
Vertically aligned InAs nanowires (NWs) doped with Si were grown self-assisted by molecular beam epitaxy on GaAs[111]B substrates covered with a thin SiO(x) layer. Using out-of-plane X-ray diffraction, the influence of Si supply on the growth process and nanostructure formation was studied. It was f...
Autores principales: | Davydok, Anton, Rieger, Torsten, Biermanns, Andreas, Saqib, Muhammad, Grap, Thomas, Lepsa, Mihail Ion, Pietsch, Ullrich |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2013
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3769066/ https://www.ncbi.nlm.nih.gov/pubmed/24046494 http://dx.doi.org/10.1107/S0021889813010522 |
Ejemplares similares
-
Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams
por: Bussone, Genziana, et al.
Publicado: (2013) -
Lattice parameter accommodation between GaAs(111) nanowires and Si(111) substrate after growth via Au-assisted molecular beam epitaxy
por: Davydok, Anton, et al.
Publicado: (2012) -
Three-wave X-ray diffraction in distorted epitaxial structures
por: Kyutt, Reginald, et al.
Publicado: (2013) -
Enhancement of field-effect mobility due to structural ordering in poly(3-hexylthiophene) films by the dip-coating technique
por: Ali, Kamran, et al.
Publicado: (2013) -
Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structures
por: Zhylik, A., et al.
Publicado: (2013)