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Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structures

A general theoretical approach to the description of epitaxial layers with essentially different cell parameters and in-plane relaxation anisotropy has been developed. A covariant description of relaxation in such structures has been introduced. An iteration method for evaluation of these parameters...

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Autores principales: Zhylik, A., Benediktovitch, A., Feranchuk, I., Inaba, K., Mikhalychev, A., Ulyanenkov, A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2013
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3769073/
https://www.ncbi.nlm.nih.gov/pubmed/24046499
http://dx.doi.org/10.1107/S0021889813006171
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author Zhylik, A.
Benediktovitch, A.
Feranchuk, I.
Inaba, K.
Mikhalychev, A.
Ulyanenkov, A.
author_facet Zhylik, A.
Benediktovitch, A.
Feranchuk, I.
Inaba, K.
Mikhalychev, A.
Ulyanenkov, A.
author_sort Zhylik, A.
collection PubMed
description A general theoretical approach to the description of epitaxial layers with essentially different cell parameters and in-plane relaxation anisotropy has been developed. A covariant description of relaxation in such structures has been introduced. An iteration method for evaluation of these parameters on the basis of the diffraction data set has been worked out together with error analysis and reliability checking. The validity of the presented theoretical approaches has been proved with a-ZnO on r-sapphire samples grown in the temperature range from 573 K up to 1073 K. A covariant description of relaxation anisotropy for these samples has been estimated with data measured for different directions of the diffraction plane relative to the sample surface.
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spelling pubmed-37690732013-09-17 Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structures Zhylik, A. Benediktovitch, A. Feranchuk, I. Inaba, K. Mikhalychev, A. Ulyanenkov, A. J Appl Crystallogr X-Ray Diffraction and Imaging A general theoretical approach to the description of epitaxial layers with essentially different cell parameters and in-plane relaxation anisotropy has been developed. A covariant description of relaxation in such structures has been introduced. An iteration method for evaluation of these parameters on the basis of the diffraction data set has been worked out together with error analysis and reliability checking. The validity of the presented theoretical approaches has been proved with a-ZnO on r-sapphire samples grown in the temperature range from 573 K up to 1073 K. A covariant description of relaxation anisotropy for these samples has been estimated with data measured for different directions of the diffraction plane relative to the sample surface. International Union of Crystallography 2013-08-01 2013-06-07 /pmc/articles/PMC3769073/ /pubmed/24046499 http://dx.doi.org/10.1107/S0021889813006171 Text en © A. Zhylik et al. 2013 http://creativecommons.org/licenses/by/2.0/uk/ This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle X-Ray Diffraction and Imaging
Zhylik, A.
Benediktovitch, A.
Feranchuk, I.
Inaba, K.
Mikhalychev, A.
Ulyanenkov, A.
Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structures
title Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structures
title_full Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structures
title_fullStr Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structures
title_full_unstemmed Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structures
title_short Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structures
title_sort covariant description of x-ray diffraction from anisotropically relaxed epitaxial structures
topic X-Ray Diffraction and Imaging
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3769073/
https://www.ncbi.nlm.nih.gov/pubmed/24046499
http://dx.doi.org/10.1107/S0021889813006171
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