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Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structures

A general theoretical approach to the description of epitaxial layers with essentially different cell parameters and in-plane relaxation anisotropy has been developed. A covariant description of relaxation in such structures has been introduced. An iteration method for evaluation of these parameters...

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Detalles Bibliográficos
Autores principales:	Zhylik, A., Benediktovitch, A., Feranchuk, I., Inaba, K., Mikhalychev, A., Ulyanenkov, A.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	International Union of Crystallography 2013
Materias:	X-Ray Diffraction and Imaging
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3769073/ https://www.ncbi.nlm.nih.gov/pubmed/24046499 http://dx.doi.org/10.1107/S0021889813006171

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